If Military/Aerospace specified devices are required,

please contact the National Semiconductor Sales Office/

Distributors for availability and specifications.

All Pins

−0.5V to 5.6V

Power Dissipation (T

(Note 2)

Internally Limited

T

150˚C

θ

250˚C/W

Storage Temperature

−65˚C to +150˚C

Lead Temperature (Soldering, 5 sec.)

260˚C

ESD Rating (Note 3)

Human Body Model

Machine Model

1.5 kV

100V

Operating Ratings

Input Voltage (V

2.5V to 5.5V

Output Voltage (V

1.8V to 4.1V

Ambient Temperature (T

−40˚C to +85˚C

Junction Temperature (T

−40˚C to +125˚C

Electrical Characteristics

Limits in standard typeface are for T

−40˚C

≤ T

Parameter

Conditions

Min (Note 5)

Typ (Note 4)

Max (Note 5)

Units

LM3355-4.1

Output Voltage (V

4.038

4.1

4.162

V

3.977/3.936

4.1

4.223/4.264

3.977/3.936

4.1

4.223/4.264

Efficiency

I

80

%

I

75

Output Voltage Ripple

(Peak-to-Peak)

I

C

75

mV

P-P

LM3355-ALL OUTPUT VOLTAGE VERSIONS

Operating Quiescent Current

Measured at Pin V

I

375

475

µA

Shutdown Quiescent Current

SD Pin at 0V (Note 7)

2.3

5

µA

Switching Frequency

0.60

1

1.40

MHz

SD Input Threshold Low

0.2 V

IN

V

SD Input Threshold High

0.8 V

IN

V

SD Input Current

Measured at SD Pin;

SD Pin = V

0.3

µA

Note 1: “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur. Operating Ratings are conditions for which the device is

intended to be functional, but device parameter specifications may not be guaranteed. For guaranteed specifications and test conditions, see “Electrical

Characteristics”.

Note 3: The Human Body Model is a 100 pF capacitor discharged through a 1.5 k

Ω resistor into each pin. The Machine Model is a 200 pF capacitor discharged

directly into each pin.

Note 4: Typical numbers are at 25˚C and represent the most likely norm.

Note 5: All limits guaranteed at room temperature (standard typeface) and at temperature extremes (bold typeface). All room temperature limits are 100% tested

or guaranteed through statistical analysis. All limits at temperature extremes are guaranteed by correlation using standard Statistical Quality Control methods (SQC).

All limits are used to calculate Average Outgoing Quality Level (AOQL).

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