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74F1240 데이터시트(PDF) 5 Page - NXP Semiconductors |
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74F1240 데이터시트(HTML) 5 Page - NXP Semiconductors |
5 / 10 page Philips Semiconductors Product specification 74F1240, 74F1241* Buffers 1999 Jan 08 5 * Discontinued part. Please see the Discontinued Products List. RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMITS UNIT SYMBOL PARAMETER MIN NOM MAX UNIT VCC Supply voltage 4.5 5.0 5.5 V VIH High-level input voltage 2.0 V VIL Low-level input voltage 0.8 V IIK Input clamp current –18 mA IOH High-level output current –15 mA IOL Low-level output current 64 mA Tamb Operating free-air temperature range 0 +70 °C DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP MAX UNIT IO = 3mA ±10% VCC 2.4 V VO High level output voltage VCC = MIN VIL = MAX IOH = –3mA ±5% VCC 2.7 3.3 V VOH High-level output voltage VIL = MAX VIH = MIN IO = 15mA ±10% VCC 2.0 V IOH = –15mA ±5% VCC 2.0 V VO Low level output voltage VCC = MIN VIL = MAX IOL = 48mA ±10% VCC 0.38 0.55 V VOL Low-level output voltage VIL = MAX VIH = MIN IOL = 64mA ±5% VCC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = 0.0V, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current VCC = MAX, VI = 0.5V –20 µA IOZH Off-state output current, High-level voltage applied VCC = MAX, VO = 2.7V 50 µA IOZL Off-state output current, Low-level voltage applied VCC = MAX, VO = 0.5V –50 µA IOS Short-circuit output current3 VCC = MAX –100 –225 mA ICCH 22 30 mA 74F1240 ICCL VCC = MAX 58 75 mA ICC Supply current (total) ICCZ 44 58 mA ICC Supply current (total) ICCH 33 44 mA 74F1241 ICCL VCC = MAX 62 80 mA ICCZ 45 60 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
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