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74ALVT162823DGG 데이터시트(PDF) 4 Page - NXP Semiconductors

부품명 74ALVT162823DGG
상세설명  18-bit bus-interface D-type flip-flop with reset and enable with 30ohm termination resistors (3-State)
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제조업체  PHILIPS [NXP Semiconductors]
홈페이지  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

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Philips Semiconductors
Product specification
74ALVT162823
2.5V/3.3V 18-bit bus-interface D-type flip-flop with reset
and enable with 30
Ω termination resistors (3-State)
1998 Aug 27
4
FUNCTION TABLE
INPUTS
OUTPUTS
OPERATING MODE
nOE
nMR
nCE
nCP
nDx
nQ0 – nQ8
OPERATING MODE
L
L
X
X
X
L
Clear
L
H
L
h
H
Load and read data
L
H
L
l
L
Load and read data
L
H
H
X
NC
Hold
H
X
X
X
X
Z
High impedance
H = High voltage level
h
= High voltage level one set-up time prior to the Low-to-High clock transition
L
= Low voltage level
l
= Low voltage level one set-up time prior to the Low-to-High clock transition
NC= No change
X = Don’t care
Z = High impedance “off” state
↑ = Low to High clock transition
↑ = Not a Low-to-High clock transition
SCHEMATIC OF EACH OUTPUT
VCC
VCC
OUTPUT
27
27
SW00007
BUS HOLD CIRCUIT
To internal circuit
VCC
Data Input
SW00044
ABSOLUTE MAXIMUM RATINGS1, 2
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
VCC
DC supply voltage
-0.5 to +4.6
V
IIK
DC input diode current
VI < 0
-50
mA
VI
DC input voltage3
-0.5 to +7.0
V
IOK
DC output diode current
VO < 0
-50
mA
VOUT
DC output voltage3
Output in Off or High state
-0.5 to +7.0
V
IO
DC output current
Output in Low state
128
mA
IOUT
DC output current
Output in High state
-64
mA
Tstg
Storage temperature range
-65 to +150
°C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150
°C.
3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.


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