전자부품 데이터시트 검색엔진 |
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HCPL-257K 데이터시트(PDF) 1 Page - Agilent(Hewlett-Packard) |
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HCPL-257K 데이터시트(HTML) 1 Page - Agilent(Hewlett-Packard) |
1 / 14 page Description These units are single, dual and quad channel, hermetically sealed optocouplers. The products are capable of operation and storage over the full military temperature range and can be purchased as either standard product or with full MIL-PRF-38534 Class Level H or K testing or from the appropriate DSCC Drawing. All devices are manufactured and tested on a MIL-PRF- 38534 certified line and are included in the DSCC Qualified Manufacturers List QML-38534 for Hybrid Microcircuits. Hermetically Sealed, Transistor Output Optocouplers for Analog and Digital Applications Technical Data Agilent 4N55*, 5962-87679, HCPL-553X, HCPL-653X, HCPL-257K, HCPL-655X, 5962-90854, HCPL-550X *See matrix for available extensions. Features ••••• Dual Marked with Device Part Number and DSCC Drawing Number ••••• Manufactured and Tested on a MIL-PRF-38534 Certified Line ••••• QML-38534, Class H and K ••••• Five Hermetically Sealed Package Configurations ••••• Performance Guaranteed, Over -55°C to +125°C ••••• High Speed: Typically 400 kBit/s ••••• 9 MHz Bandwidth ••••• Open Collector Output ••••• 2-18 Volt VCC Range ••••• 1500 Vdc Withstand Test Voltage ••••• High Radiation Immunity ••••• 6N135, 6N136, HCPL-2530/2531, Function Compatibility ••••• Reliability Data The connection of a 0.1 µF bypass capacitor between VCC and GND is recommended. Applications ••••• Military and Space ••••• High Reliability Systems ••••• Vehicle Command, Control, Life Critical Systems ••••• Line Receivers ••••• Switching Power Supply ••••• Voltage Level Shifting ••••• Analog Signal Ground Isolation (see Figures 7, 8, and 13) ••••• Isolated Input Line Receiver ••••• Isolated Output Line Driver ••••• Logic Ground Isolation ••••• Harsh Industrial Environments ••••• Isolation for Test Equipment Systems CAUTION: It is advised that normal static precautions be taken in handling and assembly of this component to prevent damage and/or degradation which may be induced by ESD. |
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