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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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SN74ABT8646DW 데이터시트(PDF) 1 Page - Texas Instruments |
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SN74ABT8646DW 데이터시트(HTML) 1 Page - Texas Instruments |
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1 / 32 page  SN54ABT8646, SN74ABT8646 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS123F − AUGUST 1992 − REVISED APRIL 2004 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Members of the Texas Instruments SCOPE Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F646 and ’ABT646 in the Normal-Function Mode D SCOPE Instruction Set − IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ − Parallel-Signature Analysis at Inputs With Masking Option − Pseudorandom Pattern Generation From Outputs − Sample Inputs/Toggle Outputs − Binary Count From Outputs − Even-Parity Opcodes D Two Boundary-Scan Cells Per I/O for Greater Flexibility D State-of-the-Art EPIC-ΙΙB BiCMOS Design Significantly Reduces Power Dissipation D Package Options Include Plastic Small-Outline (DW) and Shrink Small-Outline (DL) Packages, Ceramic Chip Carriers (FK), and Standard Ceramic DIPs (JT) description The ’ABT8646 and scan-test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the ’F646 and ’ABT646 octal bus transceivers and registers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPE octal bus transceivers and registers. Copyright 2004, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE and EPIC- ΙΙB are trademarks of Texas Instruments. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 28 27 26 25 24 23 22 21 20 19 18 17 16 15 CLKAB SAB DIR A1 A2 A3 GND A4 A5 A6 A7 A8 TDO TMS CLKBA SBA OE B1 B2 B3 B4 VCC B5 B6 B7 B8 TDI TCK 32 1 13 14 5 6 7 8 9 10 11 B7 B8 TDI TCK TMS TDO A8 OE SBA CLKBA CLKAB SAB DIR A1 4 15 16 17 18 28 27 26 25 24 23 22 21 20 19 12 SN54ABT8646 . . . JT PACKAGE SN74ABT8646 . . . DL OR DW PACKAGE (TOP VIEW) SN54ABT8646 . . . FK PACKAGE (TOP VIEW) On products compliant to MILPRF38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters. |
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