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74LVT241DB 데이터시트(PDF) 3 Page - NXP Semiconductors |
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74LVT241DB 데이터시트(HTML) 3 Page - NXP Semiconductors |
3 / 10 page Philips Semiconductors Product specification 74LVT241 3.3V Octal buffer/line driver (3-State) 1998 Feb 19 3 LOGIC SYMBOL (IEEE/IEC) 1 2 18 4 16 6 14 812 19 17 3 15 5 13 7 11 9 EN EN SA00040 LOGIC SYMBOL 1OE 1 1A0 2 1A1 4 1A2 6 1A3 8 2OE 19 2A0 17 2A1 18 15 2A2 13 16 2A3 11 14 12 1Y0 1Y1 1Y2 1Y3 2Y0 2Y1 2Y2 2Y3 3 5 7 9 SA00039 FUNCTION TABLE INPUTS OUTPUTS 1OE 1An 2OE 2An 1Yn 2Yn L L H L L L L H H H H H H X L X Z Z H = High voltage level L = Low voltage level X = Don’t care Z = High impedance “off ” state ABSOLUTE MAXIMUM RATINGS1, 2 SYMBOL PARAMETER CONDITIONS RATING UNIT VCC DC supply voltage –0.5 to +4.6 V VI DC input voltage3 –0.5 to +7.0 V VOUT DC output voltage3 Output in Off or High state –0.5 to +7.0 V IO DC output current Output in Low state 128 mA IOUT DC output current Output in High state –64 mA IIK DC input diode current VI < 0 –50 mA IOK DC output diode current VO < 0 –50 mA Tstg Storage temperature range –65 to 150 °C NOTES: 1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150 °C. 3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed. |
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