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AD5680BRJZ-2500RL7 데이터시트(PDF) 10 Page - Analog Devices |
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AD5680BRJZ-2500RL7 데이터시트(HTML) 10 Page - Analog Devices |
10 / 20 page AD5680 Rev. 0 | Page 10 of 20 TERMINOLOGY Relative Accuracy or Integral Nonlinearity (INL) For the DAC, relative accuracy or integral nonlinearity is a measurement of the maximum deviation, in LSBs, from a straight line passing through the endpoints of the DAC transfer function. Figure 4 shows a typical INL vs. code plot. Differential Nonlinearity (DNL) Differential nonlinearity is the difference between the measured change and the ideal 1 LSB change between any two adjacent codes. A specified differential nonlinearity of ±1 LSB maximum ensures monotonicity. Figure 5 shows a typical DNL vs. code plot. Zero-Code Error Zero-code error is a measurement of the output error when zero code (0x00000) is loaded to the DAC register. Ideally, the output should be 0 V. The zero-code error is always positive in the AD5680 because the output of the DAC cannot go below 0 V. It is due to a combination of the offset errors in the DAC and the output amplifier. Zero-code error is expressed in mV. A plot of zero-code error vs. temperature can be seen in Figure 7. Full-Scale Error Full-scale error is a measurement of the output error when full- scale code (0x3FFFF) is loaded to the DAC register. Ideally, the output should be VDD − 1 LSB. Full-scale error is expressed in percent of full-scale range. Gain Error This is a measure of the span error of the DAC. It is the deviation in slope of the DAC transfer characteristic from ideal expressed as a percent of the full-scale range. Zero-Code Error Drift This is a measurement of the change in zero-code error with a change in temperature. It is expressed in μV/°C. Gain Temperature Coefficient This is a measurement of the change in gain error with changes in temperature. It is expressed in (ppm of full-scale range)/°C. Offset Error Offset error is a measure of the difference between VOUT (actual) and VOUT (ideal) expressed in mV in the linear region of the transfer function. Offset error is measured on the AD5680 with Code 2048 loaded in the DAC register. It can be negative or positive. DC Power Supply Rejection Ratio (PSRR) This indicates how the output of the DAC is affected by changes in the supply voltage. PSRR is the ratio of the change in VOUT to a change in VDD for full-scale output of the DAC. It is measured in dB. VREF is held at 2 V, and VDD is varied by ±10%. Output Voltage Settling Time This is the amount of time it takes for the output of a DAC to settle to a specified level for a ¼ to ¾ full-scale input change and is measured from the 24th falling edge of SCLK. Digital-to-Analog Glitch Impulse Digital-to-analog glitch impulse is injected into the analog output when the input code in the DAC register changes state. It is normally specified as the area of the glitch in nV-s, and is measured when the digital input code is changed by 1 LSB at the major carry transition (0x1FFFF to 0x20000). See Figure 16. Digital Feedthrough Digital feedthrough is a measure of the impulse injected into the analog output of the DAC from the digital inputs of the DAC, but is measured when the DAC output is not updated. It is specified in nV-s and measured with a full-scale code change on the data bus, that is, from all 0s to all 1s and vice versa. Total Harmonic Distortion (THD) This is the difference between an ideal sine wave and its attenuated version using the DAC. The sine wave is used as the reference for the DAC. The THD is a measurement of the harmonics present on the DAC output. It is measured in dB. Noise Spectral Density This is a measurement of the internally generated random noise. Random noise is characterized as a spectral density (voltage per √Hz). It is measured by loading the DAC to midscale and measuring noise at the output. It is measured in nV/√Hz. Figure 21 shows a plot of noise spectral density. |
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