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CD54ACT08 데이터시트(PDF) 1 Page - Texas Instruments |
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CD54ACT08 데이터시트(HTML) 1 Page - Texas Instruments |
1 / 9 page CD54ACT08, CD74ACT08 QUADRUPLE 2-INPUT POSITIVE-AND GATES SCHS312B – JANUARY 2001 – REVISED JUNE 2002 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Inputs Are TTL-Voltage Compatible D Speed of Bipolar F, AS, and S, With Significantly Reduced Power Consumption D Balanced Propagation Delays D Buffered Inputs D ±24-mA Output Drive Current – Fanout to 15 F Devices D SCR-Latchup-Resistant CMOS Process and Circuit Design D Exceeds 2-kV ESD Protection Per MIL-STD-883, Method 3015 description The ’ACT08 devices are quadruple 2-input positive-AND gates. These devices perform the Boolean function Y + A • BorY + A ) B in positive logic. ORDERING INFORMATION TA PACKAGE† ORDERABLE PART NUMBER TOP-SIDE MARKING PDIP – E Tube CD74ACT08E CD74ACT08E 55 °Cto125°C SOIC M Tube CD74ACT08M ACT08M –55 °C to 125°C SOIC – M Tape and reel CD74ACT08M96 ACT08M CDIP – F Tube CD54ACT08F3A CD54ACT08F3A † Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package. FUNCTION TABLE (each gate) INPUTS OUTPUT A B Y H H H L XL X L L logic diagram, each gate (positive logic) A B Y PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. 1 2 3 4 5 6 7 14 13 12 11 10 9 8 1A 1B 1Y 2A 2B 2Y GND VCC 4B 4A 4Y 3B 3A 3Y CD54ACT08 ...F PACKAGE CD74ACT08 ...E OR M PACKAGE (TOP VIEW) Copyright 2002, Texas Instruments Incorporated Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters. |
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