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M40Z300MH1TR 데이터시트(PDF) 9 Page - STMicroelectronics |
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M40Z300MH1TR 데이터시트(HTML) 9 Page - STMicroelectronics |
9 / 21 page 9/21 M40Z300, M40Z300W The M40Z300/W only monitors the battery when a nominal VCC is applied to the device. Thus appli- cations which require extensive durations in the battery back-up mode should be powered-up peri- odically (at least once every few months) in order for this technique to be beneficial. Additionally, if a battery low is indicated, data integrity should be verified upon power-up via a checksum or other technique. The BL pin is an open drain output and an appropriate pull-up resistor to VCC should be chosen to control the rise time. VCC Noise And Negative Going Transients ICC transients, including those produced by output switching, can produce voltage fluctuations, re- sulting in spikes on the VCC bus. These transients can be reduced if capacitors are used to store en- ergy which stabilizes the VCC bus. The energy stored in the bypass capacitors will be released as low going spikes are generated or energy will be absorbed when overshoots occur. A ceramic by- pass capacitor value of 0.1µF (as shown in Figure 9.) is recommended in order to provide the needed filtering. In addition to transients that are caused by normal SRAM operation, power cycling can generate neg- ative voltage spikes on VCC that drive it to values below VSS by as much as one volt. These negative spikes can cause data corruption in the SRAM while in battery backup mode. To protect from these voltage spikes, STMicroelectronics recom- mends connecting a schottky diode from VCC to VSS (cathode connected to VCC, anode to VSS). Schottky diode 1N5817 is recommended for through hole and MBRS120T3 is recommended for surface mount. Figure 9. Supply Voltage Protection AI00622 VCC 0.1 µF DEVICE VCC VSS |
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