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SN74ABT18245ADLR 데이터시트(PDF) 2 Page - Texas Instruments |
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SN74ABT18245ADLR 데이터시트(HTML) 2 Page - Texas Instruments |
2 / 32 page SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999 2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 description (continued) Four dedicated test pins observe and control the operation of the test circuitry: test-data input (TDI), test-data output (TDO), test-mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54ABT18245A is characterized for operation over the full military temperature range of –55 °C to 125°C. The SN74ABT18245A is characterized for operation from –40 °C to 85°C. FUNCTION TABLE (normal mode, each 9-bit section) INPUTS OPERATION OE DIR OPERATION L L B data to A bus L H A data to B bus H X Isolation |
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