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MC100EPT622FAR2G 데이터시트(PDF) 3 Page - ON Semiconductor |
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MC100EPT622FAR2G 데이터시트(HTML) 3 Page - ON Semiconductor |
3 / 7 page MC100EPT622 http://onsemi.com 3 Table 2. ATTRIBUTES Characteristics Value Internal Input Pulldown Resistor N/A Internal Input Pullup Resistor N/A ESD Protection Human Body Model Machine Model Charged Device Model > 2 kV > 150 V > 2 kV Moisture Sensitivity, Indefinite Time Out of Drypack Level 2 Flammability Rating Oxygen Index: 28 to 34 UL 94 V−0 @ 0.125 in Transistor Count 596 Devices Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test Table 3. MAXIMUM RATINGS Symbol Parameter Condition 1 Condition 2 Rating Unit VCC Power Supply VEE = 0 V 5 V VI Input Voltage VEE = 0 V VI VCC 5 to 0 V Iout Output Current Continuous Surge 50 100 mA mA TA Operating Temperature Range −40 to +85 °C Tstg Storage Temperature Range −65 to +150 °C qJA Thermal Resistance (Junction−to−Ambient) 0 lfpm 500 lfpm 32 LQFP 32 LQFP 80 55 °C/W °C/W qJC Thermal Resistance (Junction−to−Case) Standard Board 32 LQFP 12 to 17 °C/W Tsol Wave Solder <2 to 3 sec @ 248°C 265 °C Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. Table 4. TTL INPUT DC CHARACTERISTICS VCC = 3.3 V, GND= 0.0 V, TA = −40°C to 85°C Symbol Characteristic Condition Min Typ Max Unit IIH Input HIGH Current VIN= 2.7 V 25 mA IIHH Input HIGH Current MAX VIN= VCC 100 mA IIL Input LOW Current VIN= 0.5 V −0.6 mA VIK Input Clamp Voltage IIN= −18 mA −1.2 −0.9 V VIH Input HIGH Voltage 2.0 V VIL Input LOW Voltage 0.8 V NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. |
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