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MC10114P 데이터시트(PDF) 4 Page - ON Semiconductor |
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MC10114P 데이터시트(HTML) 4 Page - ON Semiconductor |
4 / 8 page MC10114 http://onsemi.com 4 ELECTRICAL CHARACTERISTICS (continued) TEST VOLTAGE VALUES (Volts) @ Test Temperature VIHH* VILH* VIHL* VILL* VEE –30 °C +0.110 –0.890 –1.890 –2.890 –5.2 +25 °C +0.190 –0.850 –1.810 –2.850 –5.2 +85 °C +0.300 –0.825 –1.700 –2.825 –5.2 Pin Under TEST VOLTAGE APPLIED TO PINS LISTED BELOW (V ) Characteristic Symbol Under Test VIHH* VILH* VIHL* VILL* VEE (VCC) Gnd Power Supply Drain Current IE 8 8 1, 16 Input Current IinH 4 8 1, 16 IinL 4 8, 4 1, 16 Output Voltage Logic 1 VOH 2 3 8 8 1, 16 1, 16 Output Voltage Logic 0 VOL 2 3 8 8 1, 16 1, 16 Threshold Voltage Logic 1 VOHA 2 3 8 8 1, 16 1, 16 Threshold Voltage Logic 0 VOLA 2 3 8 8 1, 16 1, 16 Reference Voltage VBB 11 8 1, 16 Common Mode Rejection Test VOH 2 3 4 5 5 4 8 8 1, 16 1, 16 VOL 2 3 4 5 5 4 8 8 1, 16 1, 16 Switching Times (50 Ω Load) –3.2 V +2.0 V Propagation Delay t4+2+ t4–2– t4+3– t4–3+ 2 2 3 3 8 8 8 8 1, 16 1, 16 1, 16 1, 16 Rise Time (20 to 80%) t2+ t3+ 2 3 8 8 1, 16 1, 16 Fall Time (20 to 80%) t2– t3– 2 3 8 8 1, 16 1, 16 *VIHH = Input Logic 1 level shifted positive one volt for common mode rejection tests VILH = Input Logic 0 level shifted positive one volt for common mode rejection tests VIHL = Input Logic 1 level shifted negative one volt for common mode rejection tests VILL = Input Logic 0 level shifted negative one volt for common mode rejection tests Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained. Outputs are terminated through a 50-ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the same manner. |
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