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TDA1313T 데이터시트(PDF) 6 Page - NXP Semiconductors |
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TDA1313T 데이터시트(HTML) 6 Page - NXP Semiconductors |
6 / 15 page July 1993 6 Philips Semiconductors Objective specification Stereo continuous calibration DAC (CC-DAC) TDA1313; TDA1313T Table 1 Mode application LIMITING VALUES In accordance with the Absolute Maximum Rating System (IEC 134). Notes 1. Human body model: C = 100 pF; R = 1500 Ω; 3 zaps positive and negative. 2. Machine model: C = 200 pF; L = 0.5 µH; R = 10 Ω; 3 zaps positive and negative. THERMAL RESISTANCE 4/8FSSEL LRSEL/RSI MODE FIGURE 0 1 4FS/left = HIGH 6 0 0 4FS/left = LOW 6 1 data right 8FS 5 SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT VDD supply voltage − 6.0 V TXTAL maximum crystal temperature − +150 °C Tstg storage temperature −55 +150 °C Tamb operating ambient temperature −40 +85 °C VES electrostatic handling note 1 −2000 +2000 V note 2 −200 +200 V SYMBOL PARAMETER THERMAL RESISTANCE Rth j-a from junction to ambient in free air DIL16 75 K/W SO16 120 K/W Fig.3 Calibration principle; (a) calibration (b) operation. handbook, halfpage MGE231 Cgs S1 M1 (a) (b) Vgs S2 IREF IO + Cgs S1 M1 Vgs S2 IREF IREF IO + |
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