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TLC2543QDWREP 데이터시트(PDF) 1 Page - Texas Instruments

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부품명 TLC2543QDWREP
상세설명  12-BIT ANALOG-TO-DIGITAL CONVERTER WITH SERIAL CONTROL AND 11 ANALOG INPUTS
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제조업체  TI [Texas Instruments]
홈페이지  http://www.ti.com
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TLC2543QDWREP 데이터시트(HTML) 1 Page - Texas Instruments

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FEATURES
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AIN0
AIN1
AIN2
AIN3
AIN4
AIN5
AIN6
AIN7
AIN8
GND
VCC
EOC
I/O CLOCK
DATA INPUT
DATA OUT
CS
REF +
REF −
AIN10
AIN9
(TOP VIEW)
DW PACKAGE
DESCRIPTION/ORDERING INFORMATION
TLC2543-EP
12-BIT ANALOG-TO-DIGITAL CONVERTER
WITH SERIAL CONTROL AND 11 ANALOG INPUTS
SGLS125A – JULY 2002 – REVISED NOVEMBER 2006
• Controlled Baseline
• Programmable Power Down
One Assembly/Test Site, One Fabrication
• Programmable Output Data Length
Site
• CMOS Technology
• Extended Temperature Performance of –40°C
• Application Report Available (2)
to 125
°C (TLC2543Q) and –55°C to 125°C
(TLC2543M)
• Enhanced Diminishing Manufacturing Sources
(DMS) Support
• Enhanced Product Change Notification
• Qualification Pedigree (1)
• 12-Bit-Resolution Analog-to-Digital Converter
(ADC)
• 10-µs Conversion Time Over Operating
Temperature
• 11 Analog Input Channels
• Three Built-In Self-Test Modes
• Inherent Sample-and-Hold Function
• Linearity Error . . . ±1 LSB Max
• On-Chip System Clock
• End-of-Conversion (EOC) Output
• Unipolar or Bipolar Output Operation (Signed
Binary With Respect to 1/2 the Applied
Voltage Reference)
• Programmable Most Significant Bit (MSB) or
Least Significant Bit (LSB) First
(1)
Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
(2)
Microcontroller Based Data Acquisition Using the TLC2543
performance and environmental limits.
12-bit Serial-Out ADC (SLAA012)
The TLC2543 is a 12-bit, switched-capacitor, successive-approximation, analog-to-digital converter (ADC). This
device, with three control inputs [chip select (CS), input-output clock (I/O CLOCK), and address input (DATA
INPUT)], is designed for communication with the serial port of a host processor or peripheral through a serial
3-state output. The device allows high-speed data transfers from the host.
In addition to the high-speed converter and versatile control capability, the device has an on-chip 14-channel
multiplexer that can select any 1 of 11 inputs or any 1 of 3 internal self-test voltages. The sample-and-hold
function is automatic. At the end of conversion, the end-of-conversion (EOC) output goes high to indicate that
conversion is complete. The converter incorporated in the device features differential high-impedance reference
inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise.
A switched-capacitor design allows low-error conversion over the full operating temperature range.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2002–2006, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.


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