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TLC2543QDWREP 데이터시트(PDF) 1 Page - Texas Instruments |
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TLC2543QDWREP 데이터시트(HTML) 1 Page - Texas Instruments |
1 / 25 page www.ti.com FEATURES 1 2 3 4 5 6 7 8 9 10 20 19 18 17 16 15 14 13 12 11 AIN0 AIN1 AIN2 AIN3 AIN4 AIN5 AIN6 AIN7 AIN8 GND VCC EOC I/O CLOCK DATA INPUT DATA OUT CS REF + REF − AIN10 AIN9 (TOP VIEW) DW PACKAGE DESCRIPTION/ORDERING INFORMATION TLC2543-EP 12-BIT ANALOG-TO-DIGITAL CONVERTER WITH SERIAL CONTROL AND 11 ANALOG INPUTS SGLS125A – JULY 2002 – REVISED NOVEMBER 2006 • Controlled Baseline • Programmable Power Down – One Assembly/Test Site, One Fabrication • Programmable Output Data Length Site • CMOS Technology • Extended Temperature Performance of –40°C • Application Report Available (2) to 125 °C (TLC2543Q) and –55°C to 125°C (TLC2543M) • Enhanced Diminishing Manufacturing Sources (DMS) Support • Enhanced Product Change Notification • Qualification Pedigree (1) • 12-Bit-Resolution Analog-to-Digital Converter (ADC) • 10-µs Conversion Time Over Operating Temperature • 11 Analog Input Channels • Three Built-In Self-Test Modes • Inherent Sample-and-Hold Function • Linearity Error . . . ±1 LSB Max • On-Chip System Clock • End-of-Conversion (EOC) Output • Unipolar or Bipolar Output Operation (Signed Binary With Respect to 1/2 the Applied Voltage Reference) • Programmable Most Significant Bit (MSB) or Least Significant Bit (LSB) First (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified (2) Microcontroller Based Data Acquisition Using the TLC2543 performance and environmental limits. 12-bit Serial-Out ADC (SLAA012) The TLC2543 is a 12-bit, switched-capacitor, successive-approximation, analog-to-digital converter (ADC). This device, with three control inputs [chip select (CS), input-output clock (I/O CLOCK), and address input (DATA INPUT)], is designed for communication with the serial port of a host processor or peripheral through a serial 3-state output. The device allows high-speed data transfers from the host. In addition to the high-speed converter and versatile control capability, the device has an on-chip 14-channel multiplexer that can select any 1 of 11 inputs or any 1 of 3 internal self-test voltages. The sample-and-hold function is automatic. At the end of conversion, the end-of-conversion (EOC) output goes high to indicate that conversion is complete. The converter incorporated in the device features differential high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating temperature range. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Copyright © 2002–2006, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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