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TC74VHC221AF 데이터시트(PDF) 7 Page - Toshiba Semiconductor |
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TC74VHC221AF 데이터시트(HTML) 7 Page - Toshiba Semiconductor |
7 / 15 page TC74VHC123,221AF/AFN/AFT/AFK 2007-10-19 7 Absolute Maximum Ratings (Note) Characteristics Symbol Rating Unit Supply voltage range VCC −0.5 to 7.0 V DC input voltage VIN −0.5 to 7.0 V DC output voltage VOUT −0.5 to VCC + 0.5 V Input diode current IIK −20 mA Output diode current IOK ±20 mA DC output current IOUT ±25 mA DC VCC/ground current ICC ±50 mA Power dissipation PD 180 mW Storage temperature Tstg −65 to 150 °C Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Operating Ranges (Note 1) Characteristics Symbol Rating Unit Supply voltage VCC 2.0 to 5.5 V Input voltage VIN 0 to 5.5 V Output voltage VOUT 0 to VCC V Operating temperature Topr −40 to 85 °C Input rise and fall time dt/dv 0 to 100 (VCC = 3.3 ± 0.3 V) 0 to 20 (VCC = 5 ± 0.5 V) ns/V External capacitor CX No limitation (Note 2) F External resistor RX ≥ 5 k (Note 3) (VCC = 2.0 V) ≥ 1 k (Note 3) (VCC ≥ 3.0 V) Ω Note 1: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND. Note 2: The maximum allowable values of CX and RX are a function of leakage of capacitor CX, the leakage of TC74VHC123A/221A, and leakage due to board layout and surface resistance. Susceptibility to externally induced noise signals may occur for RX > 1 MΩ. |
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