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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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74AHCT00BQ 데이터시트(PDF) 7 Page - NXP Semiconductors |
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74AHCT00BQ 데이터시트(HTML) 7 Page - NXP Semiconductors |
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7 / 13 page  74AHC_AHCT00_3 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 03 — 8 January 2008 7 of 13 NXP Semiconductors 74AHC00; 74AHCT00 Quad 2-input NAND gate Test data is given in Table 9. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. RL = Load resistance. S1 = Test selection switch. Fig 7. Load circuit for switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aad983 DUT VCC VCC VI VO RT RL S1 CL open PULSE GENERATOR Table 9. Test data Type Input Load S1 position VI tr, tf CL RL tPHL, tPLH tPZH, tPHZ tPZL, tPLZ 74AHC00 VCC ≤ 3.0 ns 15 pF, 50 pF 1 k Ω open GND VCC 74AHCT00 3.0 V ≤ 3.0 ns 15 pF, 50 pF 1 k Ω open GND VCC |
유사한 부품 번호 - 74AHCT00BQ |
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유사한 설명 - 74AHCT00BQ |
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