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SN74BCT8245ADWG4 데이터시트(PDF) 2 Page - Texas Instruments |
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SN74BCT8245ADWG4 데이터시트(HTML) 2 Page - Texas Instruments |
2 / 29 page SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 description (continued) Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54BCT8245A is characterized for operation over the full military temperature range of –55 °C to 125°C. The SN74BCT8245A is characterized for operation from 0 °C to 70°C. FUNCTION TABLE (normal mode) INPUTS OPERATION OE DIR OPERATION L L B data to A bus L H A data to B bus H X Isolation logic symbol† SCAN ’BCT8245A TDI 14 TDI TCK-IN G3 24 TMS 12 TMS 13 TCK 3 EN1 [BA] 1 DIR TCK-OUT OE Φ 2 3 EN2 [AB] 11 TDO 11 TDO A1 23 A2 22 B1 2 B2 3 A3 21 B3 4 A4 20 B4 5 A5 19 B5 7 A6 17 B6 8 A7 16 B7 9 A8 15 B8 10 † This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. Pin numbers shown are for the DW, JT, and NT packages. |
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