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TC1054-3.3VCT 데이터시트(PDF) 2 Page - TelCom Semiconductor, Inc |
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TC1054-3.3VCT 데이터시트(HTML) 2 Page - TelCom Semiconductor, Inc |
2 / 12 page TC1054 50mA CMOS LDO WITH SHUTDOWN AND ERROR OUTPUT 2 PRELIMINARY INFORMATION TC1054-01 6/12/97 ELECTRICAL CHARACTERISTICS: VIN = VOUT + 1V, IL = 0.1mA, CL = 3.3µF, SHDN > VIH, TA = 25°C, unless otherwise noted. BOLDFACE type specifications apply for junction temperatures of – 40 °C to +125 °C. Symbol Parameter Test Conditions Min Typ Max Units VIN Input Operating Voltage — — 6.5 V IOUTMAX Maximum Output Current 50 —— mA VOUT Output Voltage Note 1 VR – 2.5% VR ±0.5% VR + 2.5% V TC VOUT VOUT Temperature Coefficient Note 2 — — — ppm/ °C 40 ∆VOUT/∆VIN Line Regulation (VR + 1V) < VIN < 6V — 0.01 0.05 %/V ∆VOUT/VOUT Load Regulation IL = 0.1mA to IOUTMAX — 0.5 — % (Note 3) VIN – VOUT Dropout Voltage IL = 0.1mA — 5 — mV IL = 20mA — 65 IL = 50mA — 95 (Note 4) IGND Ground Pin Current IL = IOUTMAX, (Note 5) — 0 — µA IIN Supply Current SHDN = VIH, IL = 0 — 50 — µA IINSD Shutdown Supply Current SHDN = 0V — — 0.05 µA ROUT Output Resistance during Shutdown SHDN < VIL 100 x VR 160 x VR —k Ω PSRR Power Supply Rejection Ratio FRE ≤ 1kHz — 64 — dB IOUTSC Output Short Circuit Current VOUT = 0V — 200 450 mA ∆VOUT/∆PD Thermal Regulation Note 6 — 0.04 — %W TSD Thermal Shutdown Die Temperature — 160 — °C ∆TSD Thermal Shutdown Hysteresis — 10 — °C eN Output Noise IL = IOUTMAX — 160 — µV SHDN Input VIH SHDN Input High Threshold VIN = 2.5V to 6.5V 45 — — %VIN VIL SHDN Input Low Threshold VIN = 2.5V to 6.5V — — 15 %VIN ABSOLUTE MAXIMUM RATINGS* Input Voltage ................................................................. 7V Output Voltage ............................. (– 0.3V) to (VIN + 0.3V) Power Dissipation .................... Internally Limited (Note 7) Operating Temperature Range ........ – 40 °C < TJ < 125°C Storage Temperature ............................ – 65 °C to +150°C Maximum Voltage on Any Pin ............ VIN +0.3V to – 0.3V Lead Temperature (Soldering, 10 Sec.) ................ +260 °C *Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions above those indicated in the operation sections of the specifications is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. |
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