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SN74ABT18640 데이터시트(PDF) 2 Page - Texas Instruments |
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SN74ABT18640 데이터시트(HTML) 2 Page - Texas Instruments |
2 / 30 page SN54ABT18640, SN74ABT18640 SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS SCBS267C – FEBRUARY 1994 – REVISED JULY 1996 2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 description (continued) Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN74ABT18640 is available in TI’s shrink small-outline (DL) and thin shrink small-outline (DGG) packages, which provide twice the I/O pin count and functionality of standard small-outline packages in the same printed-circuit-board area. The SN54ABT18640 is characterized for operation over the full military temperature range of –55 °C to 125°C. The SN74ABT18640 is characterized for operation from –40 °C to 85°C. FUNCTION TABLE (normal mode, each 9-bit section) INPUTS OPERATION OE DIR OPERATION L L B data to A bus L HA data to B bus H X Isolation |
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