전자부품 데이터시트 검색엔진 |
|
SN74BCT8373ADWR 데이터시트(PDF) 4 Page - Texas Instruments |
|
SN74BCT8373ADWR 데이터시트(HTML) 4 Page - Texas Instruments |
4 / 26 page SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 4 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 Terminal Functions TERMINAL NAME DESCRIPTION 1D – 8D Normal-function data inputs. See function table for normal-mode logic. Internal pullups force these inputs to a high level if left unconnected. GND Ground LE Normal-function latch-enable input. See function table for normal-mode logic. An internal pullup forces LE to a high level if left unconnected. OE Normal-function output-enable input. See function table for normal-mode logic. An internal pullup forces OE to a high level if left unconnected. 1Q – 8Q Normal-function data outputs. See function table for normal-mode logic. TCK Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous to TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK. An internal pullup forces TCK to a high level if left unconnected. TDI Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data through the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected. TDO Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data through the instruction register or selected data register. An internal pullup forces TDO to a high level when it is not active and is not driven from an external source. TMS Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through its TAP controller states. An internal pullup forces TMS to a high level if left unconnected. The TMS pin also provides the optional test reset signal of IEEE Standard 1149.1-1990. This is implemented by recognizing a third logic level, double-high (VIHH), at TMS. VCC Supply voltage |
유사한 부품 번호 - SN74BCT8373ADWR |
|
유사한 설명 - SN74BCT8373ADWR |
|
|
링크 URL |
개인정보취급방침 |
ALLDATASHEET.CO.KR |
ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |