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SN74CBTLV1G125DBV 데이터시트(PDF) 1 Page - Texas Instruments |
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SN74CBTLV1G125DBV 데이터시트(HTML) 1 Page - Texas Instruments |
1 / 8 page SN74CBTLV1G125 LOW VOLTAGE SINGLE FET BUS SWITCH SCDS057G − MARCH 1998 − REVISED OCTOBER 2003 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D 5-Ω Switch Connection Between Two Ports D Rail-to-Rail Switching on Data I/O Ports D Ioff Supports Partial-Power-Down Mode Operation description/ordering information The SN74CBTLV1G125 features a single high-speed line switch. The switch is disabled when the output-enable (OE) input is high. This device is fully specified for partial-power-down applications using Ioff. The Ioff feature ensures that damaging current will not backflow through the device when it is powered down. The device has isolation during power off. To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver. ORDERING INFORMATION TA PACKAGE† ORDERABLE PART NUMBER TOP-SIDE MARKING‡ −40 °C to 85°C SOT (SOT-23) − DBV Tape and reel SN74CBTLV1G125DBVR V25_ −40 °C to 85°C SOT (SC-70) − DCK Tape and reel SN74CBTLV1G125DCKR VM_ † Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package. ‡ The actual top-side marking has one additional character that designates the assembly/test site. FUNCTION TABLE INPUT OE FUNCTION L A port = B port H Disconnect DBV OR DCK PACKAGE (TOP VIEW) 1 2 3 5 4 OE A GND VCC B Copyright 2003, Texas Instruments Incorporated Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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