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SN74AUC2G126DCUR 데이터시트(PDF) 2 Page - Texas Instruments

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부품명 SN74AUC2G126DCUR
상세설명  DUAL BUS BUFFER GATE WITH 3-STATE OUTPUTS
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SN74AUC2G126DCUR 데이터시트(HTML) 2 Page - Texas Instruments

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1A
1Y
1OE
1
2
6
2A
2OE
7
5
3
2Y
Absolute Maximum Ratings
(1)
SN74AUC2G126
DUAL BUS BUFFER GATE
WITH 3-STATE OUTPUTS
SCES533C – DECEMBER 2003 – REVISED JANUARY 2007
ORDERING INFORMATION
TA
PACKAGE(1)
ORDERABLE PART NUMBER
TOP-SIDE MARKING(2)
NanoFree™ – WCSP (DSBGA)
Reel of 3000
SN74AUC2G126YZPR
_ _ _UN_
0.23-mm Large Bump – YZP (Pb-free)
–40
°C to 85°C
SSOP – DCT
Reel of 3000
SN74AUC2G126DCTR
U26_ _ _
VSSOP – DCU
Reel of 3000
SN74AUC2G126DCUR
UN_
(1)
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
(2)
DCT: The actual top-side marking has three additional characters that designate the year, month, and assembly/test site.
DCU: The actual top-side marking has one additional character that designates the assembly/test site.
YZP: The actual top-side marking has three preceding characters to denote year, month, and sequence code, and one following
character to designate the assembly/test site. Pin 1 identifier indicates solder-bump composition (1 = SnPb,
• = Pb-free).
FUNCTION TABLE
(EACH BUFFER)
INPUTS
OUTPUT
Y
OE
A
H
H
H
H
L
L
L
X
Z
LOGIC DIAGRAM (POSITIVE LOGIC)
over operating free-air temperature range (unless otherwise noted)
MIN
MAX
UNIT
VCC
Supply voltage range
–0.5
3.6
V
VI
Input voltage range(2)
–0.5
3.6
V
VO
Voltage range applied to any output in the high-impedance or power-off state(2)
–0.5
3.6
V
VO
Output voltage range(2)
–0.5
VCC + 0.5
V
IIK
Input clamp current
VI < 0
–50
mA
IOK
Output clamp current
VO < 0
–50
mA
IO
Continuous output current
±20
mA
Continuous current through VCC or GND
±100
mA
DCT package
220
θ
JA
Package thermal impedance(3)
DCU package
227
°C/W
YZP package
102
Tstg
Storage temperature range
–65
150
°C
(1)
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
(3)
The package thermal impedance is calculated in accordance with JESD 51-7.
2
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