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TLP2108 데이터시트(PDF) 5 Page - Toshiba Semiconductor |
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TLP2108 데이터시트(HTML) 5 Page - Toshiba Semiconductor |
5 / 11 page TLP2108 2008-11-26 5 TEST CIRCUIT 7: Switching Time Test Circuit TEST CIRCUIT 8: Switching Time Test Circuit TEST CIRCUIT 9: Common-Mode Transient Immunity Test Circuit VOH VOL tpLH tpHL 1.3 V 50% tf tr 90% 10% IF 1 3 6 7 8 VCC GND IELD 5 4 2 + - SW B → VCC VCM VO 0.1 μF IF A P.G.: Pulse generator CL includes probe and stray capacitance. 0.1 μF IF monitor CL=15 pF CL 1 3 6 7 8 VCC GND SHIELD 5 4 2 VCC VO RIN=100 Ω IF=3 mA(P.G) (f=50 kHz , duty=50%) VOH VOL tpLH tpHL 1.3 V 50% tf tr 90% 10% IF ) ( ) ( 800 s t f V H CM μ = ) ( ) ( 800 s t r V L CM μ = VCM 10% 90% 1000 V ・ SW B : IF=0 mA ・ SW A : IF=5 mA 1 V 17V VO tr tf CML CMH IF=3 mA(P.G) (f=50 kHz , duty=50%) IF monitor P.G.: Pulse generator CL includes probe and stray capacitance. 620 Ω 0.1 μF RIN=100 Ω CL=15 pF CL 1 3 6 7 8 VCC GND SHIELD 5 4 2 5 5V VCC VO |
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