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74ALVCH32501EC 데이터시트(PDF) 9 Page - NXP Semiconductors

부품명 74ALVCH32501EC
상세설명  36-bit universal bus transceiver with direction pin; 3-state
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제조업체  PHILIPS [NXP Semiconductors]
홈페이지  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74ALVCH32501EC 데이터시트(HTML) 9 Page - NXP Semiconductors

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2004 Oct 13
9
Philips Semiconductors
Product specification
36-bit universal bus transceiver with direction pin;
3-state
74ALVCH32501
Notes
1. All typical values are measured at VCC = 2.5 V and Tamb =25 °C.
2. All typical values are measured at Tamb =25 °C.
3. All typical values are measured at VCC = 3.3 V and Tamb =25 °C.
th
hold time
nAn after nCPAB↑ or nBn after nCPBA
see Figs 7 and 8 50 pF
1.6
0.3
ns
hold time CP HIGH or LOW
nAn after nLEAB↓ or nBn after nLEBA
see Figs 7 and 8 50 pF
1.5
0.1
ns
fmax
maximum clock frequency
see Figs 5 and 8 50 pF
150
333
MHz
VCC = 3.0 V to 3.6 V; tr =tf ≤ 2.5 ns; note 3
tPHL/tPLH
propagation delay
nAn to nBn; nBn to nAn
see Figs 4 and 8 50 pF
1.0
3.0
4.2
ns
nLEBA to nAn; nLEAB to nBn
see Figs 5 and 8 50 pF
1.3
3.4
4.8
ns
nCPBA to nAn; nCPAB to nBn
see Figs 5 and 8 50 pF
1.4
3.3
4.9
ns
tPZH/tPZL
3-state output enable time nOEAB to nBn
see Figs 6 and 8 50 pF
1.0
2.4
4.6
ns
3-state output enable time nOEBA to nAn
see Figs 6 and 8 50 pF
1.1
2.5
5.0
ns
tPHZ/tPLZ
3-state output disable time nOEAB to nBn
see Figs 6 and 8 50 pF
1.4
2.9
5.0
ns
3-state output disable time nOEBA to nAn
see Figs 6 and 8 50 pF
1.3
3.1
4.2
ns
tW
pulse width nLEAB or nLEBA HIGH
see Figs 5 and 8 50 pF
3.3
0.9
ns
pulse width nCPAB or nCPBA
HIGH or LOW
see Figs 5 and 8 50 pF
3.3
1.1
ns
tsu
set-up time
nAn before nCPAB↑ or nBn before nCPBA
see Figs 7 and 8 50 pF
+1.3
−0.3
ns
set-up time CP HIGH or LOW
nAn before nLEAB↓ or nBn before nLEBA
see Figs 7 and 8 50 pF
1.0
0.3
ns
th
hold time
nAn after nCPAB↑ or nBn after nCPBA
see Figs 7 and 8 50 pF
+1.3
−0.4
ns
hold time CP HIGH or LOW
nAn after nLEAB↓ or nBn after nLEBA
see Figs 7 and 8 50 pF
1.2
0.1
ns
fmax
maximum clock frequency
see Figs 5 and 8 50 pF
150
340
MHz
SYMBOL
PARAMETER
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
WAVEFORMS
CL


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