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B32656S1224562 데이터시트(PDF) 17 Page - EPCOS |
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17 / 31 page Technical data Operating temperature range Max. operating temperature Top,max +110 °C Upper category temperature Tmax +100 °C Lower category temperature Tmin 55 °C Rated temperature TR +85 °C Dissipation factor tan δ (in 10-3) at CR ≤0.1 µF 0.1 µF<C R ≤1 µF CR >1 µF at 20 °C 1 kHz 0.5 0.5 (upper limit values) 10 kHz 0.8 1.5 100 kHz 5.0 Insulation resistance Rins CR ≤ 0.33 µF CR > 0.33 µF or time constant τ = C R Rins 100 G Ω 30000 s at 20 °C, rel. humidity ≤ 65% (minimum as-delivered values) DC test voltage 1.6 VR, 2 s Category voltage VC TA ( °C) DC voltage derating AC voltage derating (continuous operation with VDC TA ≤ 85 VC = VR VC,RMS = VRMS or VAC at f ≤ 1 kHz) 85<TA ≤100 V C = VR (165 TA)/80 VC,RMS=VRMS (165 TA)/80 Operating voltage Vop for TA ( °C) DC voltage (max. hours) AC voltage (max. hours) short operating periods TA ≤ 85 Vop = 1.25 VC (2000 h) Vop = 1.0 VC,RMS (2000 h) (VDC or VAC at f ≤ 1 kHz) 85<TA ≤100 V op = 1.25 VC (1000 h) Vop = 1.0 VC,RMS (1000 h) Damp heat test 56 days/40 °C/93% relative humidity Limit values after damp Capacitance change ∆C/C ≤ 3% heat test Dissipation factor change ∆ tan δ ≤ 0.5 10-3 (at 1 kHz) ≤ 1.0 10-3 (at 10 kHz) Insulation resistance Rins or time constant τ = C R Rins ≥ 50% of minimum as-delivered values Reliability: Failure rate λ Service life tSL 1 fit ( ≤ 1 10-9/h) at 0.5 V R, 40 °C 200 000 h at 1.0 VR, 85 °C For conversion to other operating conditions and temperatures, refer to chapter "Quality, 2 Reliability". Failure criteria: Total failure Short circuit or open circuit Failure due to variation Capacitance change ∆C/C > 10% of parameters Dissipation factor tan δ > 4 upper limit value Insulation resistance Rins or time constant τ = C R Rins < 1500 M Ω (C R ≤0.33 µF) < 500 s (CR>0.33 µF) B32656S Snubber (wound) Page 17 of 31 Please read Cautions and warnings and Important notes at the end of this document. |
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