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STK15C88 데이터시트(PDF) 8 Page - Cypress Semiconductor |
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STK15C88 데이터시트(HTML) 8 Page - Cypress Semiconductor |
8 / 17 page STK15C88 Document Number: 001-50593 Rev. *C Page 8 of 17 Data Retention and Endurance Parameter Description Min Unit DATAR Data Retention 100 Years NVC Nonvolatile STORE Operations 1,000 K Capacitance In the following table, the capacitance parameters are listed.[4] Parameter Description Test Conditions Max Unit CIN Input Capacitance TA = 25 C, f = 1 MHz, VCC = 0 to 3.0 V 5pF COUT Output Capacitance 7 pF Thermal Resistance In the following table, the thermal resistance parameters are listed.[4] Parameter Description Test Conditions 28-pin SOIC (300 mil) 28-pin SOIC (330 mil) Unit JA Thermal Resistance (Junction to Ambient) Test conditions follow standard test methods and procedures for measuring thermal impedance, per EIA / JESD51. TBD TBD C/W JC Thermal Resistance (Junction to Case) TBD TBD C/W Figure 4. AC Test Loads 5.0V Output 30 pF R1 480 R2 255 AC Test Conditions Input Pulse Levels .................................................. 0 V to 3 V Input Rise and Fall Times (10% - 90%)........................ <5 ns Input and Output Timing Reference Levels ................... 1.5 V Note 4. These parameters are guaranteed by design and are not tested. [+] Feedback |
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