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AD9257-65EBZ 데이터시트(PDF) 8 Page - Analog Devices

부품명 AD9257-65EBZ
상세설명  Octal, 14-Bit, 40/65 MSPS, Serial LVDS
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제조업체  AD [Analog Devices]
홈페이지  http://www.analog.com
Logo AD - Analog Devices

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AD9257
Data Sheet
Rev. 0 | Page 8 of 40
ABSOLUTE MAXIMUM RATINGS
THERMAL CHARACTERISTICS
Table 6.
Parameter
Rating
Electrical
AVDD to AGND
−0.3 V to +2.0 V
DRVDD to AGND
−0.3 V to +2.0 V
Digital Outputs
(D± x, DCO+, DCO−, FCO+, FCO−) to
AGND
−0.3 V to +2.0 V
CLK+, CLK− to AGND
−0.3 V to +2.0 V
VIN+ x, VIN− x to AGND
−0.3 V to +2.0 V
SCLK/DTP, SDIO/DFS, CSB to AGND
−0.3 V to +2.0 V
SYNC, PDWN to AGND
−0.3 V to +2.0 V
RBIAS to AGND
−0.3 V to +2.0 V
VREF, SENSE to AGND
−0.3 V to +2.0 V
Environmental
Operating Temperature Range (Ambient)
−40°C to +85°C
Maximum Junction Temperature
150°C
Lead Temperature (Soldering, 10 sec)
300°C
Storage Temperature Range (Ambient)
−65°C to +150°C
The exposed paddle must be soldered to the ground plane for
the LFCSP package. Soldering the exposed paddle to the PCB
increases the reliability of the solder joints and maximizes the
thermal capability of the package.
Table 7. Thermal Resistance
Package Type
Airflow
Velocity
(m/sec)
θJA1,2
θJC1, 3
θJB1, 4
Ψ
JT
1, 2
Unit
0
22.3
1.4
N/A
0.1
°C/W
1.0
19.5
N/A
11.8
0.2
°C/W
64-Lead LFCSP
9 mm × 9 mm
(CP-64-4)
2.5
17.5
N/A
N/A
0.2
°C/W
1 Per JEDEC 51-7, plus JEDEC 25-5 2S2P test board.
2 Per JEDEC JESD51-2 (still air) or JEDEC JESD51-6 (moving air).
3 Per MIL-Std 883, Method 1012.1.
4 Per JEDEC JESD51-8 (still air).
Typical θJA is specified for a 4-layer PCB with a solid ground
plane. As shown Table 7, airflow improves heat dissipation,
which reduces θJA. In addition, metal in direct contact with the
package leads from metal traces, through holes, ground, and
power planes reduces θJA.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION


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