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SI4355 데이터시트(PDF) 9 Page - Silicon Laboratories |
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SI4355 데이터시트(HTML) 9 Page - Silicon Laboratories |
9 / 34 page Si4355 Rev 1.0 9 1.1. Definition of Test Conditions Production Test Conditions: TA =+25 °C VDD =+3.3VDC Sensitivity measured at 434 MHz using a PN15 modulated input signal and with packet handler mode enabled. External reference signal (XIN) = 1.0 VPP at 30 MHz, centered around 0.8 VDC Production test schematic (unless noted otherwise) All RF input and output levels referred to the pins of the Si4355 (not the RF module) Qualification Test Conditions: TA = –40 to +85 °C (typical = 25 °C) VDD = +1.8 to +3.6 VDC (typical = 3.3 VDC) Using reference design or production test schematic All RF input and output levels referred to the pins of the Si4355 (not the RF module) |
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