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CDCE421ARGER 데이터시트(PDF) 10 Page - Texas Instruments

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부품명 CDCE421ARGER
상세설명  Fully-Integrated, Wide Range, Low-Jitter Crystal Oscillator Clock Generator
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제조업체  TI1 [Texas Instruments]
홈페이지  http://www.ti.com
Logo TI1 - Texas Instruments

CDCE421ARGER 데이터시트(HTML) 10 Page - Texas Instruments

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Enter Programming Mode
0
0
0
0
1
1
t
7
t
1
t
6
t
5
t
2
t
F
t
R
t
3
t
4
CE
SDATA
DATA
SDATA
DELAYED
EEPROM Programming
CDCE421A
SCAS873 – APRIL 2009..................................................................................................................................................................................................... www.ti.com
Figure 2 shows the timing behavior of data to be written into SDATA. The sequence shown is '001100'. If the
high period is as short as t1, this period is interpreted as '0'. If the high period is as long as t3, this period is
interpreted as a '1'. This behavior is achieved by shifting the incoming signal SDATA by time t5 into signal
SDATA_DELAYED. As Figure 2 shows, SDATA_DELAYED can be used to latch (or strobe) SDATA. The
specification for the timings t1 through t7, tR and tF are shown in Table 5.
Figure 2. SDATA/CE Timing
Table 5. SDATA/CE Timing Requirements(1)
PARAMETER
MIN
TYP
MAX
UNIT
fSDATACLK
Repeat frequency of programming
60
70
80
kHz
t1
Low signal: High pulse duration
0.2 t
ms
t2
Low signal: Low pulse duration during Entering Programming sequence
0.8 t
ms
Low signal: Low pulse duration during programming bits
0.8 t
ms
t3
High signal: High pulse duration
0.8 t
ms
t4
High signal: Low pulse duration during Entering Programming sequence
0.2 t
ms
High signal: Low pulse duration during programming bits
0.2 t
ms
t6
Time-out during Entering Programming Mode and Enter Readback Mode until
16
ms
next bit must occur. High-pulse or low-pulse duration each must be less than this
time; otherwise, a time-out results.
t7
EN-high time before first SDATA can be clocked in
3 t
ms
tR/tF
Rise and fall time from 20% to 80% of VDD
2
ns
(1)
t = 1/fSDATACLK.
To program the EEPROM, follow the procedure outlined in this section.
Load all the registers in RAM by writing to Word0 ... Word5. After going back to State 2, then go to State 3
(Programming EEPROM, No Locking) or State 4 (Programming EEPROM with Locking). The contents of Word0
… to Word5 are saved in the EEPROM. Wait 10ms in State 3 or State 4 when programming the EEPROM
before moving to State 2 (idle state).
NOTE:
When writing to the device for functionality testing and verification via the serial bus,
you are only accessing the RAM. The programming of the CDCE421A can only be
performed at VCC = 3.3 V and at room temperature (+25°C).
10
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Copyright © 2009, Texas Instruments Incorporated
Product Folder Link(s): CDCE421A


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