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74FCT2574ATSOCTG4 데이터시트(PDF) 1 Page - Texas Instruments |
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74FCT2574ATSOCTG4 데이터시트(HTML) 1 Page - Texas Instruments |
1 / 15 page CY74FCT2574T 8-BIT REGISTER WITH 3-STATE OUTPUTS SCCS076 – OCTOBER 2001 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Function and Pinout Compatible With FCT and F Logic D 25-Ω Output Series Resistors to Reduce Transmission-Line Reflection Noise D Reduced VOH (Typically = 3.3 V) Version of Equivalent FCT Functions D Edge-Rate Control Circuitry for Significantly Improved Noise Characteristics D Ioff Supports Partial-Power-Down Mode Operation D Matched Rise and Fall Times D Fully Compatible With TTL Input and Output Logic Levels D ESD Protection Exceeds JESD 22 – 2000-V Human-Body Model (A114-A) – 200-V Machine Model (A115-A) – 1000-V Charged-Device Model (C101) D 3-State Outputs D 12-mA Output Sink Current 15-mA Output Source Current D Edge-Triggered D-Type Inputs D 250-MHz Typical Switching Rate description The CY74FCT2574T is a high-speed, low-power, octal D-type flip-flop featuring separate D-type inputs for each flip-flop. On-chip termination resistors at the outputs reduce system noise caused by reflections. The CY74FCT2574T can replace the CY74FCT574T to reduce noise in an existing design. This device has 3-state outputs for bus-oriented applications. A buffered clock (CP) and output-enable (OE) inputs are common to all flip-flops. The CY74FCT2574T is identical to the CY74FCT2374T, except that on the CY74FCT2574T all outputs are on one side of the package and all inputs are on the other side. The flip-flops in the CY74FCT2574T store the state of their individual D inputs that meet the setup-time and hold-time requirements on the low-to-high CP transition. When OE is low, the contents of the flip-flops are available at the outputs. When OE is high, the outputs are in the high-impedance state. The state of OE does not affect the state of the flip-flops. This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down. Copyright 2001, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 1 2 3 4 5 6 7 8 9 10 20 19 18 17 16 15 14 13 12 11 OE D0 D1 D2 D3 D4 D5 D6 D7 GND VCC O0 O1 O2 O3 O4 O5 O6 O7 CP Q OR SO PACKAGE (TOP VIEW) |
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