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TLC1543-EP 데이터시트(PDF) 1 Page - Texas Instruments |
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TLC1543-EP 데이터시트(HTML) 1 Page - Texas Instruments |
1 / 25 page TLC1542EP, TLC1543EP 10BIT ANALOGTODIGITAL CONVERTERS WITH SERIAL CONTROL AND 11 ANALOG INPUTS SGLS152A − JANUARY 2004 − REVISED FEBRUARY 2006 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of −40 °C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product Change Notification D Qualification Pedigree† D 10-Bit Resolution A/D Converter D 11 Analog Input Channels D Three Built-In Self-Test Modes D Inherent Sample-and-Hold Function D Total Unadjusted Error . . . ±1 LSB Max D On-Chip System Clock D End-of-Conversion (EOC) Output D Terminal Compatible With TLC542 D CMOS Technology description The TLC1542-EP and TLC1543-EP are CMOS 10-bit switched-capacitor successive-approximation analog-to-digital converters. These devices have three inputs, a 3-state output chip select (CS), input/output clock (I/O CLOCK), address input (ADDRESS), and data output (DATA OUT)] that provide a direct 4-wire interface to the serial port of a host processor. The TLC1542-EP and TLC1543-EP allow high-speed data transfers from the host. In addition to a high-speed A /D converter and versatile control capability, the TLC1542-EP and TLC1543-EP have an on-chip 14-channel multiplexer that can select any one of 11 analog inputs or any one of three internal self-test voltages. The sample-and-hold function is automatic. At the end of the A /D conversion, the end-of-conversion (EOC) output goes high to indicate that conversion is complete. The converter incorporated in the TLC1542-EP and TLC1543-EP features differential high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating free-air temperature range. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. This document contains information on products in more than one phase of development. The status of each device is indicated on the page(s) specifying its electrical characteristics. Copyright 2006, Texas Instruments Incorporated 1 2 3 4 5 6 7 8 9 10 20 19 18 17 16 15 14 13 12 11 A0 A1 A2 A3 A4 A5 A6 A7 A8 GND VCC EOC I/O CLOCK ADDRESS DATA OUT CS REF + REF − A10 A9 DW PACKAGE (TOP VIEW) |
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