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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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74ABT16952 데이터시트(PDF) 3 Page - Fairchild Semiconductor |
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74ABT16952 데이터시트(HTML) 3 Page - Fairchild Semiconductor |
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3 / 7 page  3 www.fairchildsemi.com Absolute Maximum Ratings(Note 1) Recommended Operating Conditions Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. DC Electrical Characteristics Note 3: For 8-bit toggling, ICCD <1.4 mA/MHz. Note 4: Guaranteed, but not tested. Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C VCC Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Any Output in the Disable or Power-Off State −0.5V to +5.5V in the HIGH State −0.5V to V CC Current Applied to Output in LOW State (Max) twice the rated IOL (mA) DC Latchup Source Current −500 mA Over Voltage Latchup (I/O) 10V Free Air Ambient Temperature −40°C to +85°C Supply Voltage +4.5V to +5.5V Minimum Input Edge Rate ( ∆V/∆t) Data Input 50 mV/ns Enable Input 20 mV/ns Clock Input 100 mV/ns Symbol Parameter Min Typ Max Units VCC Conditions VIH Input HIGH Voltage 2.0 V Recognized HIGH Signal VIL Input LOW Voltage 0.8 V Recognized LOW Signal VCD Input Clamp Diode Voltage −1.2 V Min IIN = −18 mA (Non I/O Pins) VOH Output HIGH Voltage 2.5 VMin IOH = −3 mA (An, Bn) 2.0 IOH = −32 mA (An, Bn) VOL Output LOW Voltage 0.55 V Min IOL = 64 mA (An, Bn) VID Input Leakage Test 4.75 V 0.0 IID = 1.9 µA (Non-I/O Pins) All Other Pins Grounded IIH Input HIGH Current 1 µA Max VIN = 2.7V (Non-I/O Pins) (Note 4) 1VIN = VCC (Non-I/O Pins) IBVI Input HIGH Current Breakdown Test 7 µA Max VIN = 7.0V (Non-I/O Pins) IBVIT Input HIGH Current Breakdown Test (I/O) 100 µA Max VIN = 5.5V (An, Bn) IIL Input LOW Current −1 µA Max VIN = 0.5V (Non-I/O Pins) (Note 4) −1V IN = 0.0V (Non-I/O Pins) IIH + IOZH Output Leakage Current 10 µA 0V–5.5V VOUT = 2.7V (An, Bn); OEA or OEB = 2.0V IIL + IOZL Output Leakage Current −10 µA 0V–5.5V VOUT = 0.5V (An, Bn); OEA or OEB = 2.0V IOS Output Short-Circuit Current −100 −275 mA Max VOUT = 0V (An, Bn) ICEX Output HIGH Leakage Current 50 µA Max VOUT = VCC (An, Bn) IZZ Bus Drainage Test 100 µA 0.0V VOUT = 5.5V (An, Bn); All Others GND ICCH Power Supply Current 1.0 mA Max All Outputs HIGH ICCL Power Supply Current 60 mA Max All Outputs LOW ICCZ Power Supply Current 1.0 mA Max Outputs 3-STATE; All Others GND ICCT Additional ICC/Input 2.5 mA Max VI = VCC − 2.1V; All Others at VCC or GND ICCD Dynamic ICC No Load mA/ Max Outputs OPEN (Note 4) 0.18 MHz OEA or OEB = GND, Non-I/O = GND or V CC One Bit toggling, 50% duty cycle (Note 3) |
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