전자부품 데이터시트 검색엔진 |
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6N138M 데이터시트(PDF) 9 Page - Fairchild Semiconductor |
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6N138M 데이터시트(HTML) 9 Page - Fairchild Semiconductor |
9 / 14 page ©2009 Fairchild Semiconductor Corporation www.fairchildsemi.com 6N138M, 6N139M, HCPL2730M, HCPL2731M Rev. 1.0.2 9 Test Circuits Pulse Gen CM V VFF B A +- +5 V O V - IF 3 4 F V 2 1 Shield Noise 6 O 5 GND 7 8 V B V CC V L R PLH OL V VO 5 V 1.5 V F I 1.5 V T PHL T Switch at A : I = 0 mA F Switch at B : I = 1.6 mA F tr VO O V OL V 5 V 0 V 10% 10% 90% CM V 10 V 4 5 Noise 1 2 3 Shield 8 7 6 +5 V O V VCC V01 V02 GND VF1 - + F2 V F I + F I MONITOR L R 0.1 µF GND + - F2 V VF1 - +5 V CC V L V02 V R 01 VO VCM A B Pulse Gen F I +- + 3 I Monitor F 4 I/ƒ < 100µs 10% Duty Cycle tr = 5ns Generator Pulse Z = 50Ω O VF IF 2 1 VO O 6 5 GND 7 8 V B V L R CC V +5 V 0.1 µF L C = 15 pF* Test Circuit for 6N138M, 6N139M 0.1 µF Test Circuit for HCPL2730M and HCPL2731M Test Circuit for 6N138M and 6N139M Test Circuit for HCPL2730M and HCPL2731M f t FF V m R Rm 90% 1 3 4 2 Shield Noise 8 6 5 7 Shield Noise - C = 15 pF* L 0.1 µF I/ƒ < 100µs 10% Duty Cycle tr = 5ns Generator Pulse Z = 50Ω O Fig. 13 Switching Time Test Circuit Fig. 14 Common Mode Immunity Test Circuit |
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