LM2907, LM2917

FREQUENCY-TO-VOLTAGE CONVERTERS

SLFS011A – MARCH 1986 – REVISED JULY 1993

3

POST OFFICE BOX 655303

converter (tachometer) section

PARAMETER

TEST CONDITIONS

LM2907

LM2917

UNIT

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

MIN

TYP

MAX

UNIT

VIT

Input threshold voltage

VI = 250 mV,

f = 1 kHz

±8.5

±15

±40

±8.5

±15

±40

mV

Vhys

Input hysteresis (see Note 1)

VI = 250 mV,

f = 1 kHz

30

30

mV

VIO

Input offset voltage

8-pin versions

VI = 250 mV,

f = 1 kHz

5

15

5

15

mV

VIO

g

(see Note 1)

14-pin versions

VID = 250 mV, f = 1 kHz

3.5

10

3.5

10

mV

IIB

Input bias current

VI = ± 50 mV

0.1

1

0.1

1

µA

VOH

High-level output

voltage

CAP1

VI or VID = 125 mV

8.3

5

V

VOL

Low-level output

voltage

CAP1

VI or VID = – 125 mV

2.3

1.2

V

IO

Output current

CAP1 CPO

CAP1 and CPO at 6 V

140

200

240

µA

IO

Output current

CAP1, CPO

CAP1 and CPO at 3.8 V

140

200

240

µA

Leakage current

CPO

CAP1 open,

CPO at 0 V,

See Note 3

0.1

0.1

µA

Gain constant

0.9

1

1.1

0.9

1

1.1

Nonlinearity (see Note 2)

f = 1 kHz, 5 kHz, or 10 kHz

0.3

±1

0.3

±1

%

output section

PARAMETER

TEST CONDITIONS

LM2907

LM2917

UNIT

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

MIN

TYP

MAX

UNIT

VIO

Input offset voltage

VI = 6 V,

See Note 3

3

10

mV

VIO

Input offset voltage

VI = 3.8 V,

See Note 3

3

10

mV

IIB

Input bias current

VI = 6 V

50

500

nA

IIB

Input bias current

VI = 3.8 V

50

500

nA

AV

Voltage amplification

200

200

V/mV

IC

Collector output (sink) current

VC = 1 V,

VE = 0

40

50

40

50

mA

IE

Emitter output (source) current

VC = VCC, VE = VCC –2

–10

–10

mA

IC = 5 mA

0.1

0.5

0.1

0.5

VCE(sat) Collector-emitter saturation voltage

IC = 20 mA

1

1

V

()

IC = 50 mA

1

1.5

1

1.5

† V+ is the symbol for voltage applied to a series resistor to create a current source.

NOTES:

1. Hysteresis is the algebraic difference VIT+ – VIT– ; offset voltage is the difference in magnitudes |VIT +| – |VIT – |. See parameter

measurement information test circuit.

2. Nonlinearity is defined as the deviation of VO at CPO for f = 5 kHz from a straight line defined by the VO at 1 kHz and VO at 10 kHz,

with C1 = 1000 pF, R1 = 68

Ω, C2 = 0.22 µF.

3. CAP1 must be bypassed with a 0.001-

µF capacitor to prevent oscillation for these tests.