전자부품 데이터시트 검색엔진 |
|
SMP04EQ 데이터시트(PDF) 4 Page - Analog Devices |
|
SMP04EQ 데이터시트(HTML) 4 Page - Analog Devices |
4 / 15 page –4– SMP04 REV. D WAFER TEST LIMITS SMP04G Parameter Symbol Conditions Limits Units Buffer Offset Voltage VOS VIN = +6 V ±10 mV max Hold Step VHS VIN = +6 V ±4 mV max Droop Rate ∆V/∆tV IN = +6 V 25 mV/s max Output Source Current ISOURCE VIN = +6 V 1.2 mA min Output Sink Current ISINK VIN = +6 V 0.5 mA min Output Voltage Range OVR RL = 20 kΩ 0.06/10.0 V min/max RL = 10 k Ω 0.06/9.5 V min/max LOGIC CHARACTERISTICS Logic Input High Voltage VINH 2.4 V min Logic Input Low Voltage VINL 0.8 V max Logic Input Current IIN 1 µA max SUPPLY CHARACTERISTICS Power Supply Rejection Ratio PSRR 10.8 V ≤ V DD ≤ 13.2 V 60 dB min Supply Current IDD 7 mA max Power Dissipation PDIS 84 mW max NOTE Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed for standard product dice. Consult factory to negotiate specifications based on dice lot qualifications through sample lot assembly and testing. (@ VDD = +12 V, VSS = DGND = 0 V, RL = No Load, TA = +25 C, unless otherwise noted.) VOUT3 VOUT1 VOUT2 VOUT4 VIN1 VIN2 VIN3 VIN4 S/H1 S/H3 S/H4 DGND VSS VDD S/H2 Dice Characteristics Die Size: 0.80 x 0.120 mil = 9,600 sq. mil (2.032 x 3.048mm = 6.193 sq. mm) |
유사한 부품 번호 - SMP04EQ |
|
유사한 설명 - SMP04EQ |
|
|
링크 URL |
개인정보취급방침 |
ALLDATASHEET.CO.KR |
ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |