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74HCT5555N 데이터시트(PDF) 6 Page - NXP Semiconductors |
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74HCT5555N 데이터시트(HTML) 6 Page - NXP Semiconductors |
6 / 23 page September 1993 6 Philips Semiconductors Product specification Programmable delay timer with oscillator 74HC/HCT5555 TEST MODE Set S3 to a logic LOW level, this will divide the 24 stage counter into three, parallel clocking, 8-stage counters. Set S0, S1 and S2 to a logic HIGH level, this programs the counter to divide-by 28 (256). Apply a trigger pulse and clock in 255 pulses, this sets all flip-flop stages to a logic HIGH level. Set S3 to a logic HIGH level, this causes the counter to divide-by 224. Clock one more pulse into the RS input, this causes a logic 0 to ripple through the counter and output Q/Q goes from HIGH-to-LOW level. This method of testing the delay counter is faster than clocking in 224 (16 777 216) clock pulses. FUNCTION TABLE Notes 1. H = HIGH voltage level L = LOW voltage level X = don't care ↑ = LOW-to-HIGH transition ↓ = HIGH-to-LOW transition. INPUTS OUTPUTS MR A BQ Q HX X L H L ↑ X one HIGH level output pulse one LOW level output pulse LX ↓ one HIGH level output pulse one LOW level output pulse |
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유사한 설명 - 74HCT5555N |
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