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LM10QML 데이터시트(PDF) 3 Page - National Semiconductor (TI) |
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LM10QML 데이터시트(HTML) 3 Page - National Semiconductor (TI) |
3 / 28 page LM10QML www.ti.com SNOSAP1A – OCTOBER 2010 – REVISED MARCH 2013 Absolute Maximum Ratings (1) Total Supply Voltage 45V Differential Input Voltage (2) ±40V Power Dissipation (PDmax) (3) Internally Limited Output Short-circuit Duration (4) Continuous Storage Temperature Range −55°C ≤ TA ≤ +150°C Maximum Junction Temperature (TJmax) 150°C Lead Temperature (Soldering 10 seconds) 300°C Thermal Resistance θJA Still Air 150°C 500LF/Min Air flow 45°C θJC 45°C ESD Rating to be determined (1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. (2) The Input voltage can exceed the supply voltages provided that the voltage from the input to any other terminal does not exceed the maximum differential input voltage and excess dissipation is accounted for when VI< VS -. (3) The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature), θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any temperature is PDmax = (TJmax - TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower.. (4) Internal thermal limiting prevents excessive heating that could result in sudden failure, but the IC can be subjected to accelerated stress with a shorted output and worst-case conditions. Quality Conformance Inspection Mil-Std-883, Method 5005 - Group A Subgroup Description Temp °C 1 Static tests at +25 2 Static tests at +125 3 Static tests at -55 4 Dynamic tests at +25 5 Dynamic tests at +125 6 Dynamic tests at -55 7 Functional tests at +25 8A Functional tests at +125 8B Functional tests at -55 9 Switching tests at +25 10 Switching tests at +125 11 Switching tests at -55 12 Settling time at +25 13 Settling time at +125 14 Settling time at -55 Copyright © 2010–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: LM10QML |
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