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OP266W 데이터시트(PDF) 3 Page - OPTEK Technologies |
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OP266W 데이터시트(HTML) 3 Page - OPTEK Technologies |
3 / 4 page OPTEK reserves the right to make changes at any time in order to improve design and to supply the best product possible. OPTEK Technology Inc. — 1645 Wallace Drive, Carrollton, Texas 75006 Phone: (972) 323-2200 or (800) 341-4747 FAX: (972) 323-2396 sensors@optekinc.com www.optekinc.com Issue D 02/2014 Page 3 of 4 Plastic Infrared Emitting Diode OP265, OP266 Series (A, B, C, D, W) Absolute Maximum Ratings (TA = 25° C unless otherwise noted) Storage and Operating Temperature Range -40o C to +100o C Reverse Voltage 2.0 V Continuous Forward Current 50 mA Peak Forward Current (1 µs pulse width, 300 pps) 3.0 A Lead Soldering Temperature [1/16 inch (1.6 mm) from case for 5 seconds with soldering iron] 260° C Power Dissipation 100 mW(1) Elect rical Characteristics (TA = 25° C unless otherwise noted) SYMBOL PARAMETER MIN TYP MAX UNITS TEST CONDITIONS Input Diode EE (APT) Apertured Radiant Incidence OP265A, OP266A OP265B, OP266B OP265C, OP266C OP265D, OP266D 2.70 1.65 0.54 0.54 - - - - - 4.70 3.30 - mW/cm2 IF = 20 mA (2) PO Radiant Power Output OP265, OP266 (A, B, C, D) OP265W, OP266W - 1.00 - - - - mW IF = 20 mA VF Forward Voltage - - 1.80 V IF = 20 mA IR Reverse Current - - 100 µA VR= 2 V λP Wavelength at Peak Emission - 890 - nm IF = 10 mA B Spectral Bandwidth between Half Power Points - 80 - nm IF = 10 mA ∆λP /∆T Spectral Shift with Temperature OP265, OP266 (A, B, C, D) OP265W, OP266W - - ±0.30 ±0.18 - - nm/°C IF = Constant θHP Emission Angle at Half Power Points OP265, OP266 (A, B, C, D) OP265W, OP266W - - 18 90 - - Degree IF = 20 mA tr Output Rise Time - 500 - ns tf Output Fall Time - 250 - ns IF(PK)=100 mA, PW=10 µs, D.C.=10.0% Notes: 1. Derate linearly 1.33 mW/°C above 25°C 2. EE(APT) is a measurement of the average apertured rediant incidence ipon a sensing area 0.081” (2.06 mm) in diameter, perpendicular to and centered on the mechanical axis of the lens, and 0.590” (14.99 mm) from the measurement surface. EE(APT) is not necessarily uniform within the measured areas. |
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