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SSF26NS60A 데이터시트(PDF) 3 Page - Silikron Semiconductor Co.,LTD. |
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SSF26NS60A 데이터시트(HTML) 3 Page - Silikron Semiconductor Co.,LTD. |
3 / 8 page SSF26NS60A ©Silikron Semiconductor CO.,LTD. 2014.3.27 Version : 1.0 page 3 of 8 www.silikron.com Test circuits and Waveforms EAS Test Circuit Gate charge test circuit Switching Time Test Circuit Switching Waveforms Notes : ① Calculated continuous current based on maximum allowable junction temperature. Repetitive rating; pulse width limited by max. ② junction temperature. ③ The power dissipation PD is based on max. junction temperature, using junction-to-case thermal resistance. ④ The value of RθJA is measured with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C |
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