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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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SSF3341 데이터시트(PDF) 7 Page - Silikron Semiconductor Co.,LTD. |
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SSF3341 데이터시트(HTML) 7 Page - Silikron Semiconductor Co.,LTD. |
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7 / 8 page  SSF3341 ©Silikron Semiconductor CO.,LTD. 2013.03.06 Version : 2.2 page 7 of 8 www.silikron.com Ordering and Marking Information Device Marking: 3341 Package (Available) SOT-23 Operating Temperature Range C : -55 to 150 ºC Devices per Unit Package Type Units/ Tape Tapes/Inner Box Units/Inner Box Inner Boxes/Carton Box Units/Carton Box SOT23 3000 10 30000 4 120000 Reliability Test Program Test Item Conditions Duration Sample Size High Temperature Reverse Bias(HTRB) Tj=125℃ to 150℃ @ 80% of Max VDSS/VCES/VR 168 hours 500 hours 1000 hours 3 lots x 77 devices High Temperature Gate Bias(HTGB) Tj=150℃@ 100% of Max VGSS 168 hours 500 hours 1000 hours 3 lots x 77 devices |
유사한 부품 번호 - SSF3341 |
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유사한 설명 - SSF3341 |
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