전자부품 데이터시트 검색엔진 |
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SSS1004A7 데이터시트(PDF) 6 Page - Silikron Semiconductor Co.,LTD. |
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SSS1004A7 데이터시트(HTML) 6 Page - Silikron Semiconductor Co.,LTD. |
6 / 7 page SSS1004A7 ©Silikron Semiconductor CO.,LTD. 2014.04.18 Version : 1.2 page 6 of 7 www.silikron.com Ordering and Marking Information Device Marking: SSS1004A7 Package (Available) TO-263-7L Operating Temperature Range C : -55 to 175 ºC Devices per Unit Package Type Units/ Tube Tubes/Inner Box Units/Inner Box Inner Boxes/Carton Box Units/Carton Box TO-263-7L 50 20 1000 6 6000 Reliability Test Program Test Item Conditions Duration Sample Size High Temperature Reverse Bias(HTRB) Tj=175℃ @ 80% of Max VDSS/VCES/VR 168 hours 500 hours 1000 hours 3 lots x 77 devices High Temperature Gate Bias(HTGB) Tj=175℃ @ 100% of Max VGSS 168 hours 500 hours 1000 hours 3 lots x 77 devices |
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