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74AHC_AHCT1G07 데이터시트(PDF) 6 Page - NXP Semiconductors |
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74AHC_AHCT1G07 데이터시트(HTML) 6 Page - NXP Semiconductors |
6 / 12 page 74AHC_AHCT1G07 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved. Product data sheet Rev. 7 — 18 November 2014 6 of 12 NXP Semiconductors 74AHC1G07; 74AHCT1G07 Buffer with open-drain output 12. Waveforms Measurement points are given in Table 9. Fig 5. Input (A) to output (Y) propagation delays Table 9. Measurement point Type Input Output VI VM(1) VM(2) 74AHC1G07 GND to VCC 0.5 V CC 0.5 V CC 74AHCT1G07 GND to 3.0 V 1.5 V 0.5 V CC Test data is given in Table 8. Definitions for test circuit: CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to output impedance Zo of the pulse generator. For tPLZ, tPZL, S1 = VCC Fig 6. Test circuit for measuring switching times |
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