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74HC_HCT139 데이터시트(PDF) 10 Page - NXP Semiconductors |
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74HC_HCT139 데이터시트(HTML) 10 Page - NXP Semiconductors |
10 / 18 page 74HC_HCT139 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved. Product data sheet Rev. 3 — 28 March 2014 10 of 18 NXP Semiconductors 74HC139; 74HCT139 Dual 2-to-4 line decoder/demultiplexer Test data is given in Table 9. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. RL = Load resistance. S1 = Test selection switch. Fig 8. Test circuit for measuring switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aad983 DUT VCC VCC VI VO RT RL S1 CL open G Table 9. Test data Type Input Load S1 position VI tr, tf CL RL tPHL, tPLH tPZH, tPHZ tPZL, tPLZ 74HC139 VCC 6ns 15pF, 50 pF 1 k open GND VCC 74HCT139 3 V 6 ns 15 pF, 50 pF 1 k open GND VCC |
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