전자부품 데이터시트 검색엔진 |
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ISL54062IRTZ 데이터시트(PDF) 8 Page - Intersil Corporation |
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ISL54062IRTZ 데이터시트(HTML) 8 Page - Intersil Corporation |
8 / 16 page 8 FN6581.1 November 3, 2009 FIGURE 4. OFF-ISOLATION TEST CIRCUIT FIGURE 5. rON TEST CIRCUIT FIGURE 6. CROSSTALK TEST CIRCUIT FIGURE 7. ON CAPACITANCE TEST CIRCUIT Test Circuits and Waveforms (Continued) ANALYZER RL SIGNAL GENERATOR V+ C 0V OR V+ NO OR NC COM IN GND Signal direction through switch is reversed, worst case values are recorded. Repeat test for all switches. *50 Ω SOURCE V+ C 0V OR V+ NO OR NC COM IN GND VNX V1 rON = V1/100mA 100mA Repeat test for all switches. 0V OR V+ ANALYZER V+ C NO1 OR NC1 SIGNAL GENERATOR RL GND INX COM1 50 Ω NC COM2 NC2 OR NO2 Signal direction through switch is reversed, worst case values are recorded. Repeat test for all switches. *50 Ω SOURCE V+ C GND NO OR NC COM IN IMPEDANCE ANALYZER 0V OR V+ ISL54062 |
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