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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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TL750M12 데이터시트(PDF) 4 Page - Texas Instruments |
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TL750M12 데이터시트(HTML) 4 Page - Texas Instruments |
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4 / 24 page  TL750M SERIES SLVS021N – JANUARY 1988 – REVISED AUGUST 2010 www.ti.com TL750M05 ELECTRICAL CHARACTERISTICS (1) VI = 14 V, IO = 300 mA, TJ = 25°C (unless otherwise noted) TL750M05 PARAMETER TEST CONDITIONS UNIT MIN TYP MAX 4.95 5 5.05 Output voltage V TJ = 0°C to 125°C 4.9 5.1 VI = 9 V to 16 V, IO = 250 mA 10 25 Input voltage regulation mV VI = 6 V to 26 V, IO = 250 mA 12 50 Ripple rejection VI = 8 V to 18 V, f = 120 Hz 50 55 dB Output regulation voltage IO = 5 mA to 750 mA 20 50 mV IO = 500 mA 0.5 Dropout voltage V IO = 750 mA 0.6 Output noise voltage f = 10 Hz to 100 kHz 500 mV IO = 750 mA 60 75 Bias current mA IO = 10 mA 5 (1) Pulse-testing techniques maintain the junction temperature as close to the ambient temperature as possible. Thermal effects must be taken into account separately. All characteristics are measured with a 0.1-mF capacitor across the input and a 10-mF tantalum capacitor on the output, with equivalent series resistance within the guidelines shown in Figure 1. TL750M08 ELECTRICAL CHARACTERISTICS (1) VI = 14 V, IO = 300 mA, TJ = 25°C (unless otherwise noted) TL750M08 PARAMETER TEST CONDITIONS UNIT MIN TYP MAX 7.92 8 8.08 Output voltage V TJ = 0°C to 125°C 7.84 8.16 VI = 10 V to 17 V, IO = 250 mA 12 40 Input voltage regulation mV VI = 9 V to 26 V, IO = 250 mA 15 68 Ripple rejection VI = 11 V to 21 V, f = 120 Hz 50 55 dB Output regulation voltage IO = 5 mA to 750 mA 24 80 mV IO = 500 mA 0.5 Dropout voltage V IO = 750 mA 0.6 Output noise voltage f = 10 Hz to 100 kHz 500 mV IO = 750 mA 60 75 Bias current mA IO = 10 mA 5 (1) Pulse-testing techniques maintain the junction temperature as close to the ambient temperature as possible. Thermal effects must be taken into account separately. All characteristics are measured with a 0.1-mF capacitor across the input and a 10-mF tantalum capacitor on the output, with equivalent series resistance within the guidelines shown in Figure 1. 4 Submit Documentation Feedback Copyright © 1988–2010, Texas Instruments Incorporated |
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