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TC534CKW 데이터시트(PDF) 11 Page - Microchip Technology

부품명 TC534CKW
상세설명  5V Precision Data Acquisition Subsystems
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© 2002 Microchip Technology Inc.
DS21433B-page 11
TC530/TC534
4.
Calculate RINT
EXAMPLE 4-3:
5.
Calculate CINT for maximum (4V) integrator out-
put swing:
EXAMPLE 4-4:
Note:
Microchip recommended capacitor:
Evox-Rifa p/n: SMR5 334K50J03L
6.
Choose CREF and CAZ based on conversion
rate:
EXAMPLE 4-5:
Note:
Microchip recommended capacitor:
Evox-Rifa p/n: SMR5 224K50J02L4
7.
Calculate VREF.
EXAMPLE 4-6:
4.5
Power Supply Sequencing
Improper sequencing of the power supply inputs (VDD
vs. VCCD) can potentially cause an improper power-up
sequence to occur. See Section 4.6, Circuit Design/
Layout Considerations. Failing to insure a proper
power-up sequence can cause spurious operation.
4.6
Circuit Design/Layout
Considerations
1.
Separate ground return paths should be used
for the analog and digital circuitry. Use of ground
planes and trace fill on analog circuit sections is
highly recommended EXCEPT for in and around
the integrator section and CREF,CAZ (CINT,
CREF,CAZ,RINT). Stray capacitance between
these nodes and ground appears in parallel with
the components themselves and can affect
measurement accuracy.
2.
Improper sequencing of the power supply inputs
(VDD vs. VCCD) can potentially cause an
improper power-up sequence to occur in the
internal state machines. It is recommended that
the digital supply, VCCD, be powered up first.
One method of insuring the correct power-up
sequence is to delay the analog supply using a
series resistor and a capacitor. See Figure 4-1,
TC530/TC534 Typical Application.
3.
Decoupling capacitors, preferably a higher
value electrolytic or tantulum in parallel with a
small ceramic or tantalum, should be used liber-
ally. This includes bypassing the supply connec-
tions of all active components and the voltage
reference.
4.
Critical components should be chosen for stabil-
ity and low noise. The use of a metal-film
resistor
for
RINT
and
Polypropylene
or
Polyphenelyne Sulfide (PPS) capacitors for
CINT,CAZ and CREF is highly recommended.
5.
The inputs and integrator section are very high
impedance nodes. Leakage to or from these crit-
ical nodes can contribute measurement error. A
guard-ring should be used to protect the integra-
tor section from stray leakage.
6.
Circuit assemblies should be exceptionally
clean to prevent the presence of contamination
from assembly, handling or the cleaning itself.
Minute conductive trace contaminates, easily
ignored in most applications, can adversely
affect the performance of high impedance cir-
cuits. The input and integrator sections should
be made as compact and close to the TC53X as
possible.
7.
Digital and other dynamic signal conductors
should be kept as far from the TC53X’s analog
section as possible. The microcontroller or other
host logic should be kept quiet during a mea-
surement cycle. Background activities such as
keypad scanning, display refreshing and power
switching can introduce noise.
RINT =VINMAX/20 = 2/20 = 100kΩ
CINT =(TINT)(20 x 10
–6)/ (V
S –0.9)
= (.066)(20 x 10–6)/(4.1)
=.32
µF (use closest value: 0.33µF)
Conversions/sec
= 1/(TAZ +TINT +2TINT +2msec)
= 1/(66msec + 66msec + 132msec + 2msec)
= 3.7 conversions/sec
from which CAZ =CREF =0.22µF (Table 5-1)
(VS –0.9) (CINT)(RINT)
VREF =
2(TINT)
=(4.1) (0.33x1–6)(105) / 2(.066)
= 1.025V


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