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LC72717PW-NH 데이터시트(PDF) 2 Page - ON Semiconductor |
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LC72717PW-NH 데이터시트(HTML) 2 Page - ON Semiconductor |
2 / 27 page LC72717PW No.A2064-2/27 Specifications Absolute Maximum Ratings at Ta = 25 C, VSS = 0V Parameter Symbol Conditions Ratings Unit Maximum supply voltage VDD -0.3 to +4.0 V Input voltage VIN1 A0/CL, A1/CE, A2/DI, RST, STNBY (VDD is equal to 2.7V or more.) -0.3 to +5.6 V A0/CL, A1/CE, A2/DI, RST, STNBY (VDD is less than 2.7V.) -0.3 to VDD+0.3 V VIN2 Input pin other than VIN1 -0.3 to VDD+0.3 V Output voltage VOUT Output pin -0.3 to VDD+0.3 V Output current IOUT1 INT, RDY, DREQ, D0 to D15, DO 0 to 2.0 mA IOUT2 Output pin other than IOUT1 0 to 1.0 mA Allowable output current (total) ITTL Total for all the output pins 10 mA Allowable power dissipation Pd max 200 mW Operating temperature Topr Ta 85C -40 to +85 C Storage temperature Tstg -55 to +125 C Allowable Operating Ranges at Ta = -40 C to +85C, VSS = 0V Parameter Symbol Pin Name Type Conditions Ratings unit min typ max Supply voltage VDD 2.7 3.6 V Input high-level voltage VIH1 A0/CL, A1/CE, A2/DI, RST, STNBY Schmitt 0.7VDD 5.5 V VIH2 IOCNT1, IOCNT2, DACK D0, D1, D2, D3, D4, D5, D6, D7 WR, RD, A3, CS Schmitt 0.7VDD VDD V VIH3 SP, BUSWD, TIN, TPC1, TPC2, TOSEL1, TOSEL2 0.7VDD VDD V Input low-level voltage VIL1 A0/CL, A1/CE, A2/DI, RST, STNBY Schmitt 0.0 0.3VDD V VIL2 IOCNT1, IOCNT2, DACK D0, D1, D2, D3, D4, D5, D6, D7 WR, RD, A3, CS Schmitt 0.0 0.3VDD V VIL3 SP, BUSWD, TIN, TPC1, TPC2, TOSEL1, TOSEL2 0.0 0.3VDD V Oscillation frequency FOSC XIN, XOUT Oscillation circuit Within 250ppm 7.2 MHz XIN input sensitivity VXI XIN Capacitive coupling 400 mVrms Input amplitude VMPX1 MPXIN SCF 100% demodulation composite VDD=3.3V 120 500 mVrms VMPX2 MPXIN SCF 100% demodulation composite VDD=2.7V 120 450 mVrms Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. |
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