DLP3000

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DLPS022B – JANUARY 2012 – REVISED MARCH 2015

6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted).

(1)

MIN

MAX

UNIT

SUPPLY VOLTAGES

(2)

–0.5

4

V

(2)

–0.5

4

V

(2) (3) (4)

–0.5

8.75

V

(2) (4)

–0.5

17

V

(2)

–11

0.5

V

8.75

V

INPUT VOLTAGES

–0.5

V

–20

mA

15

mA

ENVIRONMENTAL

–20

90

ºC

–40

90

ºC

Absolute temperature delta between any point on the window, ceramic,

15

°C

Dew Point (operational and non-operational)

81

ºC

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device is not implied at these or any other conditions beyond those indicated under Recommended

Operating Conditions. Exposure above Recommended Operating Conditions for extended periods may affect device reliability.

(2)

(3)

(4)

(5)

Exposure of the DMD simultaneously to any combination of the maximum operating conditions for case temperature, differential

temperature, or illumination power density will reduce the device lifetime.

(6)

DMD Temperature is the worst-case of any test point shown in Figure 11, or the active array as calculated by the Micromirror Array

Temperature Calculation.

(7)

Ceramic package temperature as measured at test point 3 (TP 3) in Figure 11.

(8)

As measured between any two points on the exterior of the package, or as predicted between any two points inside the micromirror

array cavity. Refer to the Micromirror Array Temperature Calculation for information related to calculating the micromirror array

temperature.

6.2 Storage Conditions

applicable before the DMD is installed in the final product

MIN

MAX

UNIT

DMD Storage Temperature

–40

85

°C

24

°C

28

°C

(1)

Long-term is defined as the usable life of the device.

(2)

Dew points beyond the specified long-term dew point are for short-term conditions only, where short-term is defined as less than 60

cumulative days over the usable life of the device (operating, non-operating, or storage).

6.3 ESD Ratings

VALUE

UNIT

Electrostatic discharge

±2000

V

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

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