 |
전자부품 데이터시트 검색엔진 |
|
|
전자부품 데이터시트 검색엔진 |
|
DLPC3438 데이터시트(PDF) 7 Page - Texas Instruments |
|
|
||||||||||||||||||||||||||||||
DLPC3438 데이터시트(HTML) 7 Page - Texas Instruments |
|
|
7 / 62 page  DLPC3433, DLPC3438 www.ti.com DLPS035B – FEBRUARY 2014 – REVISED JANUARY 2016 Pin Functions – Board Level Test, Debug, and Initialization (continued) PIN I/O DESCRIPTION NAME NUMBER Test pin 1 (includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output. Normal use: reserved for test output. Should be left open or unconnected for normal use. TSTPT_1 R13 B1 Note: An external pullup should not be applied to this pin to avoid putting the DLPC343x in a test mode. Without external pullup(2) With external pullup(3) Feeds TMSEL(1) Feeds TMSEL(1) Test pin 2 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output. Normal use: reserved for test output. Should be left open or unconnected for normal use. TSTPT_2 R14 B1 Note: An external pullup should not be applied to this pin to avoid putting the DLPC343x in a test mode. Without external pullup(2) With external pullup(3) Feeds TMSEL(2) Feeds TMSEL(2) Test pin 3 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of TSTPT_3 R15 B1 RESETZ and then driven as an output. Normal use: reserved for for test output. Should be left open or unconnected for normal use. Test pin 4 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of TSTPT_4 P14 B1 RESETZ and then driven as an output. Normal use: reserved for for test output. Should be left open or unconnected for normal use. Test pin 5 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of TSTPT_5 P15 B1 RESETZ and then driven as an output. Normal use: reserved for test output. Should be left open or unconnected for normal use. Test pin 6 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output. TSTPT_6 N14 B1 Normal use: reserved for test output. should be left open or unconnected for normal use. Alternative use: none. External logic shall not unintentionally pull this pin high to avoid putting the DLPC343x in a test mode. Test pin 7 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of TSTPT_7 N15 B1 RESETZ and then driven as an output. Normal use: reserved for test output. should be left open or unconnected for normal use. Copyright © 2014–2016, Texas Instruments Incorporated Submit Documentation Feedback 7 Product Folder Links: DLPC3433 DLPC3438 |
유사한 부품 번호 - DLPC3438 |
|
유사한 설명 - DLPC3438 |
|
|
링크 URL |
| 개인정보취급방침 |
| ALLDATASHEET.CO.KR |
| ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
Korean ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
