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SSM3K116TU 데이터시트(PDF) 2 Page - Toshiba Semiconductor |
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SSM3K116TU 데이터시트(HTML) 2 Page - Toshiba Semiconductor |
2 / 5 page SSM3K116TU 2014-03-01 2 Switching Time Test Circuit (a) Test Circuit (b) VIN Marking Equivalent Circuit (top view) Precaution Vth can be expressed as the voltage between gate and source when the low operating current value is ID=0.1mA for this product. For normal switching operation, VGS (on) requires a higher voltage than Vth, and VGS (off) requires a lower voltage than Vth. (The relationship can be established as follows: VGS (off) < Vth < VGS (on)) Take this into consideration when using the device. Handling Precaution When handling individual devices which are not yet mounted on a circuit board, be sure that the environment is protected against electrostatic discharge. Operators should wear anti-static clothing, and containers and other objects that come into direct contact with devices should be made of anti-static materials. (c) VOUT VDD = 10 V RG = 4.7 Ω Duty ≤ 1% VIN: tr, tf < 5 ns Common Source Ta = 25°C VDD OUT IN 2.5 V 0 10 μs tf ton 90% 10% 2.5 V 0 V 10% 90% toff tr VDD VDS (ON) KK9 1 2 3 1 2 3 |
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